1.3. Release Notes - 01_02_00¶
1.3.1. Introduction¶
This release notes provides important information that will assist you in using the SDL software package for the J721E family of devices. This document provides the product information and known issues that are specific to the SDL software package.
New features added / supported is listed below and defects fixed are highlighted in Fixed Issues. Also please check Upgrade and Compatibility for backward compatibility
1.3.2. What’s New¶
64 bit atomic write supported for MCRC_MCU_NAVSS.
1.3.3. Supported Modules¶
SDL Support for the following modules is available from previous release:
ESM
PBIST
LBIST
POK
VTM
TOG
ECC
RTI
R5F CCM
DCC
MCRC
ROM CHECKSUM
Safety Examples for the following modules:
ESM
POK
VTM
TOG
DCC
RTI
ECC
BIST
ROM_CHECKSUM
1.3.4. Upgrade and Compatibility¶
None
1.3.5. Supported Devices¶
Platform |
Supported Devices |
Supported EVMs |
|---|---|---|
J721E SR1.1 |
Functional safety Devices:
DRA829
TDA4VM
|
DRA829Vx Evaluation Module
(DRA829VXEVM)
|
1.3.6. Fixed Defects¶
ID |
Summary |
Comments |
|---|---|---|
PROC_SDL-6295 |
mcrc_app waits for UDMA interrupt in loop forever |
None |
PROC_SDL-6161 |
A72 Boot Fails after A72 PBIST |
None |
PROC_SDL-6174 |
In sdl_mcrc_test_app , return value in sdl_mcrcSemiCPU_udmaCrc API is over written. |
None |
1.3.7. Open Defects¶
ID |
Summary |
Workaround |
|---|---|---|
PROC_SDL-6298 |
sdl_pok_test_app fails for SDL_POK_VMON_EXT_OV_ID instance |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. |
PROC_SDL-6349 |
SDL ECC error injection test fails for certain IPs in ecc_func_app SDL_CBASS_ECC_AGGR0 |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
PROC_SDL-6348 |
SDL ECC error injection test fails for certain IPs in ecc_func_app SDL_ECC_MEMTYPE_MCU_CBASS_ECC_AGGR0 |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
PROC_SDL-6297 |
SDL ECC error injection test fails for certain IPs in ecc_func_app SDL_MAIN_RC_ECC_AGGR0 |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
PROC_SDL-6929 |
MCRC 64 bit atomic write not supported on MCRC Instance in Navigator Sub System(NAVSS) domain |
None - This issue is under investigation. |
PROC_SDL-6924 |
mpu_test_app fails in release mode when tested in thumb mode. |
None - This issue is under investigation. |
PROC_SDL-6925 |
pmu_test_app fails in release mode when tested in thumb mode. |
None - This issue is under investigation. |
1.3.8. Migration Information¶
Dependency on C7X image is removed for compute cluster instances. PBIST example, pbist_test_app and sdl_pbist_test_app can be tested as standalone images.
1.3.9. Tool Chain Information¶
Component |
Version |
|---|---|
TI ARM R5F Clang Compiler tools |
3.2.0.LTS |