1.5. Release Notes - 01_00_01¶
1.5.1. Introduction¶
This release notes provides important information that will assist you in using the SDL software package for the J721E family of devices. This document provides the product information and known issues that are specific to the SDL software package.
New features added / supported is listed below and defects fixed are highlighted in Fixed Issues. Also please check Upgrade and Compatibility for backward compatibility
1.5.2. What’s New¶
Update SDL to support PDK 8.6.0.
SDL Support for the following modules is available from previous release:
ESM
PBIST
LBIST
POK
VTM
TOG
ECC
RTI
R5F CCM
DCC
MCRC
Safety Examples for the following modules:
ESM
POK
VTM
TOG
DCC
RTI
ECC
BIST
1.5.3. Supported Platforms¶
Platform |
Supported Devices |
Supported EVMs |
---|---|---|
J721E SR1.1 |
Functional safety Devices:
DRA829
TDA4VM
|
DRA829Vx Evaluation Module
(DRA829VXEVM)
|
1.5.4. Fixed Issues¶
None
1.5.5. Known Issues and Limitations¶
Issue Id |
Description |
Workaround |
---|---|---|
PROC_SDL-1956 |
PBIST test case for DSS/EDP/DSI fails |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. |
PROC_SDL-1955 |
SDL_PBIST_selfTest for GPU Instance with golden vectors fails |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. |
PROC_SDL-2417 |
SDL ECC error injection test fails for certain IPs (PCIE, DSS/eDP/DSI, CSITX/RX, I3C) Metadata incomplete for certain IPs also (CPSW, OSPI, HPB) |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
PROC_SDL-5680 |
esm_test_app fails in sdlEsm_negTest |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. |
PROC_SDL-5681 |
pok_app fails with continouos callback. |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. |
PROC_SDL-5682 |
sdl_ecc_test_app fails for VIM module. |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. |
PROC_SDL-5683 |
sdl_pok_test_app fails for POK_VMON_EXT_OV |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. |
PROC_SDL-5684 |
SDL ECC error injection test fails for MSRAM32KX256E because of Metadata incomplete |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. |
PROC_SDL-5685 |
esm_wkup_mcu_app and vtm_app tests fail. |
None - This issue is under investigation. |
PROC_SDL-5686 |
mpu_func_test_app fail. |
None - This issue is under investigation. |
PROC_SDL-5687 |
sdl_vtm_test_app fails. |
None - This issue is under investigation. |
PROC_SDL-5689 |
bist_example failing in Main Infra1 and Main R5F 1 PBIST instances. |
Use pbist_test_app or sdl_pbist_test_app |
1.5.6. Migration Information¶
None
1.5.7. Tool Chain Information¶
Component |
Version |
---|---|
TI ARM R5F Clang Compiler tools |
1.3.0.LTS |