1.2. Release Notes - 01_03_00¶
1.2.1. Introduction¶
This release notes provides important information that will assist you in using the SDL software package for the J721E family of devices. This document provides the product information and known issues that are specific to the SDL software package.
New features added / supported is listed below and defects fixed are highlighted in Fixed Issues. Also please check Upgrade and Compatibility for backward compatibility
1.2.2. What’s New¶
DED testing added by default to ECC functional test
Bug fixes
1.2.3. Supported Modules¶
SDL support for the following modules are available:
R5F PMU, MPU, RAT and VIM
ESM
PBIST
LBIST
POK
VTM
TOG
ECC
RTI
R5F CCM
DCC
MCRC
ROM CHECKSUM
Safety Examples for the following modules:
ESM
POK
VTM
TOG
DCC
RTI
ECC
BIST
ROM CHECKSUM
1.2.4. Upgrade and Compatibility¶
None
1.2.5. Supported Devices¶
Platform |
Supported Devices |
Supported EVMs |
|---|---|---|
J721E SR1.1 |
Functional safety Devices:
DRA829
TDA4VM
|
DRA829Vx Evaluation Module
(DRA829VXEVM)
|
1.2.6. Fixed Defects¶
ID |
Summary |
Comments |
|---|---|---|
PROC_SDL-6924 |
mpu_test_app fails in release mode when tested in thumb mode. |
None |
PROC_SDL-6925 |
pmu_test_app fails in release mode when tested in thumb mode. |
None |
PROC_SDL-6936 |
SDL_POK_verifyConfig() API fails. |
None |
PROC_SDL-6929 |
MCRC 64 bit atomic write not supported on MCRC Instance in Navigator Sub System(NAVSS) domain |
None |
PROC_SDL-7048 |
DCC: SDL_DCC_getStatus() does not return correct status of DONE and ERR pending interrupts. |
None |
PROC_SDL-7059 |
Error in RTI Example applications (UC 1-4). |
None |
PROC_SDL-7128 |
Remove ESM Error Pin Counter Value Register from static register read API |
None |
PROC_SDL-7154 |
DCC: Remove pointers from inside SDL_DCC_status structure. |
None |
PROC_SDL-7260 |
Build: TREAT_WARNINGS_AS_ERROR buildflag is ignored, overridden in ARM build rule files. |
None |
PROC_SDL-7261 |
Build: Do not suppress gnu-variable-sized-type-not-at-end warning. |
None |
1.2.7. Open Defects¶
ID |
Summary |
Workaround |
|---|---|---|
PROC_SDL-6298 |
sdl_pok_test_app fails for SDL_POK_VMON_EXT_OV_ID instance |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. |
PROC_SDL-6349 |
SDL ECC error injection test fails for certain IPs in ecc_func_app SDL_CBASS_ECC_AGGR0 |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
PROC_SDL-6348 |
SDL ECC error injection test fails for certain IPs in ecc_func_app SDL_ECC_MEMTYPE_MCU_CBASS_ECC_AGGR0 |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
PROC_SDL-6297 |
SDL ECC error injection test fails for certain IPs in ecc_func_app SDL_MAIN_RC_ECC_AGGR0 |
None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
PROC_SDL-7421 |
ECC DED test is failing for certain RAM ID’s in SDL_ECC_MEMTYPE_MAIN_MSMSC_AGGR0. |
None - This issues is under investigation |
1.2.8. Migration Information¶
Dependency on C7X image is removed for compute cluster instances. PBIST example, pbist_test_app and sdl_pbist_test_app can be tested as standalone images.
1.2.9. Tool Chain Information¶
Component |
Version |
|---|---|
TI ARM R5F Clang Compiler tools |
3.2.1.LTS |