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MSP430™CapTIvateSoftwareLibraryAPIGuide
1_83_00_05
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#include <CAPT_Type.h>
Data Fields | |
| IQ16_t | filterCount |
| IQ16_t | LTA |
| tCaptivateElementTuning * | pTuning |
| uint16_t * | pRawCount |
| uint8_t | ui8TouchThreshold |
| tDeBounceSettings | ProxDbCounter |
| tDeBounceSettings | TouchDbCounter |
| uint8_t | ui8RxPin: 4 |
| uint8_t | ui8RxBlock: 4 |
| Specifies the CapTIvate™ block on which the Rx pin resides. More... | |
| uint8_t | ui8TxPin: 4 |
| uint8_t | ui8TxBlock: 4 |
| bool | bNoiseDetected: 1 |
| The noise detected flag indicates that noise was found on the channel. More... | |
| bool | bBISTFail: 1 |
| bool | bDetect: 1 |
| bool | bProx: 1 |
| bool | bNegativeTouch: 1 |
| bool | bTouch: 1 |
| Touch status flag. Indicates when the element is in a touched state. More... | |
| bool | bElementHalt: 1 |
| Halt LTA updating immediately on this element specifically. More... | |
| bool | bReseed: 1 |
| Trigger a filter reseed on this element specifically. More... | |
| uint16_t | ui16PrevCompositeRawCount |
| The previous composite raw count for this element. More... | |
| uint16_t | ui16CompositeRawCount |
| The current composite raw count for this element. More... | |
| uint16_t | ui16NoiseCount |
| The noise spread observed during a multi-frequency conversion. More... | |
| tCsCapSize | SamplingCapSize: 2 |
| The size of sampling capacitor in this element. More... | |
| uint8_t | ui8InputBiasExtractTrim: 4 |
| The trim required to extract bias current on the input when sampling. More... | |
typedef tElement
The element structure is used to define the lowest level properties of an element. All element specific properties are stored in the struct for each element.
| IQ16_t tElement::filterCount |
Holds the current count for this element as a filtered value. If multi-frequency scanning is enabled, this value represents the composite of all measurements.
| IQ16_t tElement::LTA |
Holds the long term average for this element as a filtered value. If multi-frequency scanning is enabled, this value represents the composite of all measurements.
| tCaptivateElementTuning* tElement::pTuning |
This pointer links to the array of tuning structures. Each frequency that this element is scanned at requires a tuning structure. The tuning structure contains gain and offset configurations as defined by the automatic runtime calibration algorithm.
| uint16_t* tElement::pRawCount |
This is a pointer to an array of raw count values. each frequency that this element is scanned at requires a place to store the raw conversion result at that frequency.
| uint8_t tElement::ui8TouchThreshold |
Touch threshold for this element. Units are specified as 1/128 of the element's LTA.
| tDeBounceSettings tElement::ProxDbCounter |
De-Bounce structure that stores the current de-bounce count (in and out) for this element's proximity status flag.
| tDeBounceSettings tElement::TouchDbCounter |
De-Bounce structure that stores the current de-bounce count (in and out) for this element's touch status flag.
| uint8_t tElement::ui8RxPin |
Specifies the Rx pin on the given block that this element is connected to.
| uint8_t tElement::ui8RxBlock |
Specifies the CapTIvate™ block on which the Rx pin resides.
| uint8_t tElement::ui8TxPin |
Specifies the Tx pin on the given block that this element is connected to. Applies to projected (mutual) cap only.
| uint8_t tElement::ui8TxBlock |
Specifies the CapTIvate™ block on which the Tx pin resides. Applies to projected (mutual) cap only.
| bool tElement::bNoiseDetected |
The noise detected flag indicates that noise was found on the channel.
| bool tElement::bBISTFail |
The Built-In Self Test (BIST) feature will flag elements here that fail a built in self test. This bit may also be used to flag a max count error at an element level during run time (When a BIST is not running)
| bool tElement::bDetect |
Indicates a prox threshold crossing detection in the finite state machine. This bit is only valid when the FSM is enabled and the detection results are valid.
| bool tElement::bProx |
Proximity status flag. Indicates when the element is in a prox state. If the prox de-bounce thresholds are set to 0, then bProx = bDetect.
| bool tElement::bNegativeTouch |
Indicates a negative touch threshold crossing detection in the finite state machine. This bit is only valid when the FSM is enabled and the detection results are valid.
| bool tElement::bTouch |
Touch status flag. Indicates when the element is in a touched state.
| bool tElement::bElementHalt |
Halt LTA updating immediately on this element specifically.
| bool tElement::bReseed |
Trigger a filter reseed on this element specifically.
| uint16_t tElement::ui16PrevCompositeRawCount |
The previous composite raw count for this element.
| uint16_t tElement::ui16CompositeRawCount |
The current composite raw count for this element.
| uint16_t tElement::ui16NoiseCount |
The noise spread observed during a multi-frequency conversion.
| tCsCapSize tElement::SamplingCapSize |
The size of sampling capacitor in this element.
| uint8_t tElement::ui8InputBiasExtractTrim |
The trim required to extract bias current on the input when sampling.