To increase functional and system reliability, the memories in many device modules and subsystems are protected by Error Correcting Code (ECC), which performs Single Error Correction (SEC) and Double Error Detection (DED). Detected errors are reported via ESM. Single bit errors are corrected, and double bit errors are detected. The ECC Aggregator is connected to these memory and interconnect components which have the ECC. The ECC aggregator provides access to control and monitor the ECC protected memories in a module or subsystem.
SDL provides support for ECC aggregator configuration. Each ECC aggregator instance can be independently configured through the same SDL API by passing a different instance. The safety manual also defines test-for-diagnostics for the various IPs with ECC/parity support. The SDL also provides the support for executing ECC aggregator self-tests, using the error injection feature of the ECC aggregator. The ECC aggregators should be configured at startup, after running BIST.
Features Supported
The SDL provides support for the ECC through:
- ECC Configuration API
- ECC self-test API
- ECC error injection API
- ECC static register readback API
ECC error status APIs
The SDL ECC module requires a mapping of certain aggregator registers into the address space of the R5F Core. In these cases, the ECC module will use the DPL API SDL_DPL_addrTranslate() to get the address. The application must provide the mapped address through this call. This mapping is required for any ECC aggregator that is used which has an address which is not in the 32-bit address space. The mapping is expected to always be valid because it may be needed at runtime to get information about ECC errors that may be encountered.
There are over 13 ECC aggregators on the device each supporting multiple memories and interconnects.
Error Injection for Various RAM ID types
There are two types of ECC aggregator RAM IDs supported on the device (wrapper and interconnect). The wrapper types are used for memories where local computations are performed for particular processing cores in the device, and the interconnect types are utilized for interconnect bus signals between cores or to/from peripherals.
For wrapper RAM ID types, after injecting an error, the memory associated with that RAM ID needs to be accessed in order to trigger the error interrupt event. It is the application's responsibility to trigger the error event through memory access after injecting the error.
SysConfig Features
Features NOT Supported
Important Usage Guidelines
Example Usage of R5F ATCM0
The following shows an example of SDL R5F ECC API usage by the application for Error Injection Tests and Exception handling.
Include the below file to access the APIs
#include <sdl/r5/v0/interrupt.h>
#include "ecc_main.h"
Below are the macros specifies the RAM address, ECC aggregator and ECC aggregator RAMID for inject the ECC error
#define SDL_EXAMPLE_ECC_RAM_ADDR (0x00000510u) // R5F ATCM0 RAM address
#define SDL_EXAMPLE_ECC_AGGR SDL_R5FSS0_CORE0_ECC_AGGR
#define SDL_EXAMPLE_ECC_RAM_ID SDL_R5FSS0_CORE0_ECC_AGGR_PULSAR_SL_ATCM0_BANK0_RAM_ID
ESM callback function
int32_t SDL_ESM_applicationCallbackFunction(SDL_ESM_Inst esmInst,
uint32_t grpChannel,
uint32_t index,
uint32_t intSrc,
uintptr_t *arg)
{
int32_t retVal = 0;
uint32_t rd_data = 0;
printf("\r\nESM Call back function called : instType 0x%x, intType 0x%x, " \
"grpChannel 0x%x, index 0x%x, intSrc 0x%x \r\n",
esmInst, esmIntrType, grpChannel, index, intSrc);
printf("\r\nTake action \r\n");
if(esmIntrType == 1u){
printf("\r\nHigh Priority Interrupt Executed\r\n");
printf("\r\nRead data of DED MSS_CTRL register is 0x%u\r\n",rd_data);
printf("\r\nRead data of DED RAW MSS_CTRL register is 0x%u\r\n",rd_data);
}
else{
printf("\r\nLow Priority Interrupt Executed\r\n");
printf("\r\nRead data of SEC MSS_CTRL register is 0x%u\r\n",rd_data);
printf("\r\nRead data of SEC RAW MSS_CTRL register is 0x%u\r\n",rd_data);
}
esmError = true;
return retVal;
}
This is the list of exception handle and the parameters
{
.udefExptnHandlerArgs = ((void *)0u),
.swiExptnHandlerArgs = ((void *)0u),
.pabtExptnHandlerArgs = ((void *)0u),
.dabtExptnHandlerArgs = ((void *)0u),
.irqExptnHandlerArgs = ((void *)0u),
};
Below are the functions used to print the which exception is occured
void ECC_Test_undefInstructionExptnCallback(void)
{
printf("\r\nUndefined Instruction exception\r\n");
}
void ECC_Test_swIntrExptnCallback(void)
{
printf("\r\nSoftware interrupt exception\r\n");
}
void ECC_Test_prefetchAbortExptnCallback(void)
{
printf("\r\nPrefetch Abort exception\r\n");
}
void ECC_Test_dataAbortExptnCallback(void)
{
printf("\r\nData Abort exception\r\n");
}
void ECC_Test_irqExptnCallback(void)
{
printf("\r\nIrq exception\r\n");
}
void ECC_Test_fiqExptnCallback(void)
{
printf("\r\nFiq exception\r\n");
}
Initilize Exception handler
void ECC_Test_exceptionInit(void)
{
{
.swiExptnCallback = ECC_Test_swIntrExptnCallback,
.pabtExptnCallback = ECC_Test_prefetchAbortExptnCallback,
.dabtExptnCallback = ECC_Test_dataAbortExptnCallback,
.irqExptnCallback = ECC_Test_irqExptnCallback,
.fiqExptnCallback = ECC_Test_fiqExptnCallback,
};
return;
}
This structure defines the elements of ECC Init configuration
static SDL_ECC_MemSubType ECC_Test_R5FSS0_CORE0_subMemTypeList[SDL_R5FSS0_CORE0_MAX_MEM_SECTIONS] =
{
SDL_EXAMPLE_ECC_RAM_ID,
};
{
.
numRams = SDL_R5FSS0_CORE0_MAX_MEM_SECTIONS,
.pMemSubTypeList = &(ECC_Test_R5FSS0_CORE0_subMemTypeList[0]),
};
{
.enableBitmap = {0x00000000u, 0x00018000u, 0x00000000u, 0x00000000u,
0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u},
.priorityBitmap = {0x00000000u, 0x000010000u, 0x00000000u, 0x00000000u,
0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u },
.errorpinBitmap = {0x00000000u, 0x00018000u, 0x00000000u, 0x00000000u,
0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u},
};
Enabling the ECC module
Enabling the Event bus
Initialize ECC memory for the ECC aggregator
Initialize ESM module
result =
SDL_ESM_init(SDL_ESM_INST_MAIN_ESM0, &ECC_Test_esmInitConfig_MAIN, SDL_ESM_applicationCallbackFunction, ptr);
Initialize ECC parameters for single and double bit error injection
result =
SDL_ECC_init(SDL_EXAMPLE_ECC_AGGR, &ECC_Test_R5FSS0_CORE0_ECCInitConfig);
Execute ECC R5F ATCM0 single bit inject test
int32_t ECC_Test_run_R5FSS0_CORE0_ATCM0_BANK0_1BitInjectTest(void)
{
SDL_ErrType_t result;
int32_t retVal=0;
volatile uint32_t testLocationValue;
DebugP_log(
"\r\nR5FSS0 CORE0 ATCM0 BANK0 Single bit error inject: starting \r\n");
injectErrorConfig.
pErrMem = (uint32_t *)(SDL_EXAMPLE_ECC_RAM_ADDR);
SDL_EXAMPLE_ECC_RAM_ID,
&injectErrorConfig);
if (result != SDL_PASS ) {
retVal = -1;
} else {
testLocationValue = injectErrorConfig.
pErrMem[0];
DebugP_log(
"\r\nR5FSS0 CORE0 ATCM0 BANK0 Single bit error inject at pErrMem = 0x%p and the value of pErrMem is 0x%p :test complete\r\n",
injectErrorConfig.
pErrMem, testLocationValue);
}
return retVal;
}
Enabling the ECC module
Enabling the Event bus
Execute ECC R5F ATCM0 double bit inject test
int32_t ECC_Test_run_R5FSS0_CORE0_ATCM0_BANK0_2BitInjectTest(void)
{
SDL_ErrType_t result;
int32_t retVal=0;
volatile uint32_t testLocationValue;
DebugP_log(
"\r\nR5FSS0 CORE0 ATCM0 BANK0 Double bit error inject: starting \r\n");
injectErrorConfig.
pErrMem = (uint32_t *)(SDL_EXAMPLE_ECC_RAM_ADDR);
SDL_EXAMPLE_ECC_RAM_ID,
&injectErrorConfig);
if (result != SDL_PASS ) {
retVal = -1;
} else {
testLocationValue = injectErrorConfig.
pErrMem[0];
DebugP_log(
"\r\nR5FSS0 CORE0 ATCM0 BANK0 Double bit error inject: pErrMem fixed location = 0x%p once test complete: the value of pErrMem is 0x%p\r\n",
injectErrorConfig.
pErrMem, testLocationValue);
}
return retVal;
}
Example Usage of MSS L2
The following shows an example of SDL MSS L2 API usage by the application for Error Injection Tests and Exception handling.
Include the below file to access the APIs
Below are the macros specifies the RAM address, ECC aggregator and ECC aggregator RAMID for inject the ECC error
#define SDL_EXAMPLE_ECC_RAM_ADDR (0x70100008u)
#define SDL_EXAMPLE_ECC_AGGR SDL_SOC_ECC_AGGR
#define SDL_EXAMPLE_ECC_RAM_ID SDL_SOC_ECC_AGGR_MSS_L2_SLV2_ECC_RAM_ID
#define SDL_MSS_L2_MEM_INIT_ADDR (0x50D00240u)
#define SDL_MSS_L2_MEM_INIT_DONE_ADDR (0x50D00244u)
#define SDL_ECC_AGGR_ERROR_STATUS1_ADDR (0x53000020u)
#define SDL_ECC_MSS_L2_BANK_MEM_INIT (0xcu)
ESM callback function
int32_t SDL_ESM_applicationCallbackFunction(SDL_ESM_Inst esmInst,
uint32_t grpChannel,
uint32_t index,
uint32_t intSrc,
uintptr_t *arg)
{
int32_t retVal;
printf("\r\nESM Call back function called : instType 0x%x, intType 0x%x, " \
"grpChannel 0x%x, index 0x%x, intSrc 0x%x\r\n",
esmInst, esmIntrType, grpChannel, index, intSrc);
printf(" \r\nTake action \r\n");
if(esmIntrType == 1u){
printf("\r\nHigh Priority Interrupt Executed\r\n");
}
else{
printf("\r\nLow Priority Interrupt Executed\r\n");
}
printf("\r\nECC Error Call back function called : eccMemType %d, errorSrc 0x%x, " \
"ramId %d, bitErrorOffset 0x%04x%04x, bitErrorGroup %d\r\n",
{
}
else
{
}
esmError = true;
return retVal;
}
This structure defines the elements of ECC Init configuration
{
SDL_EXAMPLE_ECC_RAM_ID,
};
{
.
numRams = SDL_MSS_L2_MAX_MEM_SECTIONS,
.pMemSubTypeList = &(ECC_Test_MSS_L2_subMemTypeList[0]),
};
Event BitMap for ECC ESM callback for MSS
{
.enableBitmap = {0x00180000u, 0x00000000u, 0x00000000u, 0x00000000u,
0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u},
.priorityBitmap = {0x00180000u, 0x000000000u, 0x00000000u, 0x00000000u,
0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u },
.errorpinBitmap = {0x00180000u, 0x00000000u, 0x00000000u, 0x00000000u,
0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u},
};
Initialization of MSS L2 memory
SDL_REG32_WR(SDL_MSS_L2_MEM_INIT_ADDR, SDL_ECC_MSS_L2_BANK_MEM_INIT);
while(
SDL_REG32_RD(SDL_MSS_L2_MEM_INIT_DONE_ADDR)!=SDL_ECC_MSS_L2_BANK_MEM_INIT);
SDL_REG32_WR(SDL_MSS_L2_MEM_INIT_DONE_ADDR, SDL_ECC_MSS_L2_BANK_MEM_INIT);
Clearing any old interrupt presented
Initialize ECC memory for the ECC aggregator
Initialize ESM module
result =
SDL_ESM_init(SDL_ESM_INST_MAIN_ESM0, &ECC_Test_esmInitConfig_MAIN, SDL_ESM_applicationCallbackFunction, ptr);
Initialize ECC parameters for single and double bit error injection
result =
SDL_ECC_init(SDL_EXAMPLE_ECC_AGGR, &ECC_Test_R5FSS0_CORE0_ECCInitConfig);
Execute ECC MSS L2 single bit inject test
int32_t ECC_Test_run_MSS_L2RAMB_1BitInjectTest(void)
{
SDL_ErrType_t result;
int32_t retVal=0;
volatile uint32_t testLocationValue;
DebugP_log(
"\r\nMSS L2 RAMB Single bit error inject: starting \r\n");
injectErrorConfig.
pErrMem = (uint32_t *)(SDL_EXAMPLE_ECC_RAM_ADDR);
SDL_EXAMPLE_ECC_RAM_ID,
&injectErrorConfig);
if (result != SDL_PASS ) {
retVal = -1;
} else {
testLocationValue = injectErrorConfig.
pErrMem[0];
DebugP_log(
"\r\nMSS L2 RAMB Single bit error inject at pErrMem = 0x%p and the value of pErrMem is 0x%p :test complete\r\n",
injectErrorConfig.
pErrMem, testLocationValue);
}
return retVal;
}
Initialization of MSS L2 memory
SDL_REG32_WR(SDL_MSS_L2_MEM_INIT_ADDR, SDL_ECC_MSS_L2_BANK_MEM_INIT);
while(
SDL_REG32_RD(SDL_MSS_L2_MEM_INIT_DONE_ADDR)!=SDL_ECC_MSS_L2_BANK_MEM_INIT);
SDL_REG32_WR(SDL_MSS_L2_MEM_INIT_DONE_ADDR, SDL_ECC_MSS_L2_BANK_MEM_INIT);
Clearing any old interrupt presented
Initialize ECC Memory
Execute ECC MSS L2 double bit inject test
int32_t ECC_Test_run_MSS_L2RAMB_2BitInjectTest(void)
{
SDL_ErrType_t result;
int32_t retVal=0;
volatile uint32_t testLocationValue;
DebugP_log(
"\r\nMSS L2 RAMB Double bit error inject: starting \r\n");
injectErrorConfig.
pErrMem = (uint32_t *)(SDL_EXAMPLE_ECC_RAM_ADDR);
SDL_EXAMPLE_ECC_RAM_ID,
&injectErrorConfig);
testLocationValue = injectErrorConfig.
pErrMem[0];
if (result != SDL_PASS ) {
retVal = -1;
} else {
DebugP_log(
"\r\nMSS L2 RAMB Double bit error inject: pErrMem fixed location = 0x%p once test complete: the value of pErrMem is 0x%p\r\n",
injectErrorConfig.
pErrMem, testLocationValue);
}
return retVal;
}
Example Usage of MCAN
Include the below file to access the APIs
Below are the macros specifies the RAM address, ECC aggregator and ECC aggregator RAMID for inject the ECC error
#define SDL_EXAMPLE_ECC_RAM_ADDR (0x52600000u)
#define SDL_EXAMPLE_ECC_AGGR SDL_MCAN0_MCANSS_MSGMEM_WRAP_ECC_AGGR
#define SDL_EXAMPLE_ECC_RAM_ID SDL_MCAN0_MCANSS_MSGMEM_WRAP_ECC_AGGR_MCANSS_MSGMEM_WRAP_MSGMEM_ECC_RAM_ID
This structure defines the elements of ECC Init configuration
{
SDL_EXAMPLE_ECC_RAM_ID,
};
{
.
numRams = SDL_MCANA_MAX_MEM_SECTIONS,
.pMemSubTypeList = &(ECC_Test_MCANA_subMemTypeList[0]),
};
ESM callback function
int32_t SDL_ESM_applicationCallbackFunction(SDL_ESM_Inst esmInst,
uint32_t grpChannel,
uint32_t index,
uint32_t intSrc,
uintptr_t *arg)
{
int32_t retVal;
printf("\r\nESM Call back function called : instType 0x%x, intType 0x%x, " \
"grpChannel 0x%x, index 0x%x, intSrc 0x%x\r\n",
esmInst, esmIntrType, grpChannel, index, intSrc);
printf("\r\nTake action\r\n");
if(esmIntrType == 1u){
printf("\r\nHigh Priority Interrupt Executed\r\n");
}
else{
printf("\r\nLow Priority Interrupt Executed\r\n");
}
printf("\r\nECC Error Call back function called : eccMemType %d, errorSrc 0x%x, " \
"ramId %d, bitErrorOffset 0x%04x%04x, bitErrorGroup %d\r\n",
{
}
else
{
}
esmError = true;
return retVal;
}
Event BitMap for ECC ESM callback for MCAN
{
.enableBitmap = {0x0000000cu, 0x00000000u, 0x00000000u, 0x00000000u,
0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u},
.priorityBitmap = {0x00000008u, 0x000000000u, 0x00000000u, 0x00000000u,
0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u },
.errorpinBitmap = {0x0000000cu, 0x00000000u, 0x00000000u, 0x00000000u,
0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u},
};
Initialize ECC memory for the ECC aggregator
Initialize ESM module
result =
SDL_ESM_init(SDL_ESM_INST_MAIN_ESM0, &ECC_Test_esmInitConfig_MAIN, SDL_ESM_applicationCallbackFunction, ptr);
Initialize ECC parameters for single and double bit error injection
result =
SDL_ECC_init(SDL_EXAMPLE_ECC_AGGR, &ECC_Test_MCANA_ECCInitConfig);
Write some data to the RAM memory before injecting
for(i=1;i<=num_of_iterations;i++){
wr_data = (i)<<24 | (i)<<16 | (i)<<8 | i;
}
Execute ECC MCAN single bit inject test
int32_t ECC_Test_run_MCANA_1BitInjectTest(void)
{
SDL_ErrType_t result;
int32_t retVal=0;
volatile uint32_t testLocationValue;
DebugP_log(
"\r\nMCANA Single bit error inject: starting \r\n");
injectErrorConfig.
pErrMem = (uint32_t *)(SDL_EXAMPLE_ECC_RAM_ADDR);
SDL_EXAMPLE_ECC_RAM_ID,
&injectErrorConfig);
if (result != SDL_PASS ) {
retVal = -1;
} else {
testLocationValue = injectErrorConfig.
pErrMem[0];
DebugP_log(
"\r\nMCANA Single bit error inject at pErrMem = 0x%p and the value of pErrMem is 0x%p :test complete\r\n",
injectErrorConfig.
pErrMem, testLocationValue);
}
return retVal;
}
Read data from the RAM memory after injecting
for(i=1;i<=num_of_iterations;i++){
}
Write some data to the RAM memory before injecting
for(i=1;i<=num_of_iterations;i++){
wr_data = (i)<<24 | (i)<<16 | (i)<<8 | i;
}
Execute ECC MCAN double bit inject test
int32_t ECC_Test_run_MCANA_2BitInjectTest(void)
{
SDL_ErrType_t result;
int32_t retVal=0;
volatile uint32_t testLocationValue;
DebugP_log(
"\r\nMCANA double bit error inject: starting \r\n");
injectErrorConfig.
pErrMem = (uint32_t *)(SDL_EXAMPLE_ECC_RAM_ADDR);
SDL_EXAMPLE_ECC_RAM_ID,
&injectErrorConfig);
testLocationValue = injectErrorConfig.
pErrMem[0];
if (result != SDL_PASS ) {
retVal = -1;
} else {
DebugP_log(
"\r\nMCANA Double bit error inject: pErrMem fixed location = 0x%p once test complete: the value of pErrMem is 0x%p\r\n",
injectErrorConfig.
pErrMem, testLocationValue);
}
return retVal;
}
Read data from the RAM memory after injecting
for(i=1;i<=num_of_iterations;i++){
}
API
ECC Aggregator (ECC_AGGR)