SDL DCC Example

Table of Contents

• Introduction
• Supported Combinations
• Steps to Run the Example
• See Also
• Sample Output

Introduction

This example demonstrates how to configure the DCC and use it to monitor clocks in the two supported modes (continuous and single-shot modes). It also demonstrates how to receive errors generated by DCC in the DSP and Main domain.

The following methods can be used as a trigger for the DCC error event:

* Change ratio criterion for stable clocks
* Turn off power for the monitored input clock

Supported Combinations

Steps to Run the Example

• When using CCS projects to build, import the CCS project for the required combination and build it using the CCS project menu (see Using SDK with CCS Projects).
• When using makefiles to build, note the required combination and build using make command (see Using SDK with Makefiles)
• Launch a CCS debug session and run the executable, see CCS Launch, Load and Run

See Also

DCC

Sample Output

Shown below is a sample output when the application is run,

DCC Example Test Application
 
DCC_Test_init: Init ESM complete
 
 
USECASE: 0
Source clock: XTAL_CLK
Test clock: RCCLK32K
 
SDL DCC EXAMPLE TEST: Warning Seed value for valid count exceeds allowed range.
SDL DCC EXAMPLE TEST: Application will run with 0 allowed drift.
SDL DCC EXAMPLE TEST: Seed values calculation done.
SDL DCC EXAMPLE TEST: Enabling DCC and waiting for Error interrupt
SDL DCC EXAMPLE TEST: DCC Generated Error interrupt
SDL DCC EXAMPLE TEST: Indicating clock drift/change
UC-0 Completed Successfully
 
USECASE: 1
Source clock: XTAL_CLK
Test clock: SYSCLK0
 
SDL DCC EXAMPLE TEST: Seed values calculation done.
SDL DCC EXAMPLE TEST: DCC Generated completion interrupt
SDL DCC EXAMPLE TEST: No Clock Drift was observed
UC-1 Completed Successfully
 
USECASE: 2
Source clock: XTAL_CLK
Test clock: SYSCLK0
 
SDL DCC EXAMPLE TEST: Seed values calculation done.
SDL DCC EXAMPLE TEST: Enabling DCC and running for some time
UC-2 Completed Successfully
 
USECASE: 3
Source clock: RCCLK10M
Test clock: SYSCLK0
 
SDL DCC EXAMPLE TEST: Seed values calculation done.
SDL DCC EXAMPLE TEST: DCC Generated completion interrupt
SDL DCC EXAMPLE TEST: No Clock Drift was observed
UC-3 Completed Successfully
 
USECASE: 4
Source clock: RCCLK10M
Test clock: RCCLK32K
 
SDL DCC EXAMPLE TEST: Warning Seed value for valid count exceeds allowed range.
SDL DCC EXAMPLE TEST: Application will run with 0 allowed drift.
SDL DCC EXAMPLE TEST: Seed values calculation done.
SDL DCC EXAMPLE TEST: Enabling DCC and waiting for Error interrupt
SDL DCC EXAMPLE TEST: DCC Generated Error interrupt
SDL DCC EXAMPLE TEST: Indicating clock drift/change
UC-4 Completed Successfully
 
USECASE: 5
Source clock: RCCLK10M
Test clock: RCCLK32K
 
SDL DCC EXAMPLE TEST: Warning Seed value for valid count exceeds allowed range.
SDL DCC EXAMPLE TEST: Application will run with 0 allowed drift.
SDL DCC EXAMPLE TEST: Seed values calculation done.
SDL DCC EXAMPLE TEST: Enabling DCC and waiting for Error interrupt
SDL DCC EXAMPLE TEST: DCC Generated Error interrupt
SDL DCC EXAMPLE TEST: Indicating clock drift/change
UC-5 Completed Successfully
 
USECASE: 6
Source clock: XTAL_CLK
Test clock: RCCLK32K
 
SDL DCC EXAMPLE TEST: Seed values calculation done.
SDL DCC EXAMPLE TEST: Enabling DCC and running for some time
UC-6 Completed Successfully
 
USECASE: 7
Source clock: XTAL_CLK
Test clock: MAIN_SYSCLK0
 
SDL DCC EXAMPLE TEST: Seed values calculation done.
SDL DCC EXAMPLE TEST: Enabling DCC and waiting for Error interrupt
SDL DCC EXAMPLE TEST: DCC Generated Error interrupt
SDL DCC EXAMPLE TEST: Indicating clock drift/change
UC-7 Completed Successfully
 
USECASE: 8
Source clock: RCCLK10M
Test clock: XTAL_CLK
 
SDL DCC EXAMPLE TEST: Seed values calculation done.
SDL DCC EXAMPLE TEST: Enabling DCC and running for some time
UC-8 Completed Successfully
 
 All tests have passed.