2.4. Release Notes - 01_04_00¶
2.4.1. Introduction¶
This release notes provides important information that will assist you in using the SDL software package for the J721S2 family of devices. This document provides the product information and known issues that are specific to the SDL software package.
New features added / supported is listed below and defects fixed are highlighted in Fixed Issues. Also please check Upgrade and Compatibility for backward compatibility
2.4.2. What’s New¶
Bug fixes
2.4.3. Supported Modules¶
SDL support for the following modules are available:
R5F PMU, MPU, RAT and VIM
ESM
PBIST
LBIST
POK
VTM
TOG
ECC
RTI
R5F CCM
DCC
MCRC
ROM CHECKSUM
Safety Examples for the following modules are provided:
ESM
POK
VTM
MTOG
STOG
DCC
RTI
ECC
BIST
ROM CHECKSUM
2.4.4. Upgrade and Compatibility¶
None.
2.4.5. Supported Devices¶
Supported Platform |
|---|
J721S2 |
2.4.6. Fixed Defects¶
ID |
Module |
Summary |
Comments |
|---|---|---|---|
PROC_SDL-7823 |
POK |
Setting trim value for non-Ping pong mode POKs accesses invalid offset |
None. |
PROC_SDL-7650 |
POK |
POK instance IPOK_VDD_CPU1 not included in the SDL header file |
None. |
PROC_SDL-7612 |
ESM |
Remove ESM Error Pin Counter Value Register from static register read API |
None. |
PROC_SDL-7487 |
TOG |
Duplicate macro definition SDL_IP_TOG_TOP_H_ in the SDL header files (STOG and MTOG) |
None. |
PROC_SDL-7456 |
PBIST |
Incorrect devices used in test and example config for Main R5F 1 |
None. |
PROC_SDL-7447 |
ECC |
Incorrect macro names for SDL_MCU_FSS0_FSS_OSPI1 ECC aggregator |
None. |
PROC_SDL-7433 |
ECC |
ECC DED test is failing for certain RAM ID’s for SDL_COMPUTE_CLUSTER0_8 |
None - This issue is under investigation. |
PROC_SDL-7432 |
ECC |
ECC DED test is failing for certain RAM ID’s for SDL_COMPUTE_CLUSTER0_7 |
None - This issue is under investigation. |
PROC_SDL-7402 |
BIST |
Mismatch between function declaration and definition for SDL_PBIST_{start, startNeg} and SDL_LBIST_programConfig |
None. |
PROC_SDL-4142 |
PBIST |
PBIST MAINR5F1 instance fails in back-to-back runs |
None - This issue is under investigation. |
PROC_SDL-8316 |
MCRC |
SDL MCRC test is failing for MAIN NAVSS instance in release mode |
None. |
2.4.7. Open Defects¶
ID |
Module |
Summary |
Workaround |
|---|---|---|---|
PROC_SDL-6368 |
ECC |
Error Injection fails for ECC Aggregator ECC_AGGR0 for certain RAM ID’s. |
None - updating of metadata and investigation of failues is in progress. Due to this, the ECC error inject functionality for the mentioned IPs and endpoints is not usable in this release. |
PROC_SDL-6357 |
ECC |
Error Injection fails for ECC Aggregator ECC_AGGR4 for certain RAM ID’s. |
None - updating of metadata and investigation of failues is in progress. Due to this, the ECC error inject functionality for the mentioned IPs and endpoints is not usable in this release. |
PROC_SDL-4141 |
TOG |
1 STOG instances error injection test is failing and are not included in the test application. (STOG17) |
None - This issue is under investigation. |
PROC_SDL-7431 |
ECC |
ECC DED test is failing for certain RAM ID’s for SDL_COMPUTE_CLUSTER0_0 |
None - This issue is under investigation. |
PROC_SDL-8248 |
ECC |
SDL ECC error injection test for PCIE ECC aggregators failure |
None - This issue is under investigation. Accessing some PCIE ECC Aggregator leads to data abort. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
PROC_SDL-8249 |
ECC |
SDL ECC error injection test for CSI ECC aggregators failure |
None - This issue is under investigation. Accessing some CSI ECC Aggregators leads to data abort. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
PROC_SDL-8258 |
ECC |
SDL ECC error injection test for DSS ECC aggregators failure |
None - This issue is under investigation. Accessing some DSS ECC Aggregators leads to data abort. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
PROC_SDL-8286 |
ECC |
SDL ECC error injection test for I3C ECC aggregators failure |
None - This issue is under investigation. Accessing some I3C ECC Aggregators leads to data abort. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
2.4.8. Migration Information¶
Dependency on C7X image is removed for compute cluster instances. PBIST example, pbist_test_app and sdl_pbist_test_app can be tested as standalone images.
2.4.9. Tool Chain Information¶
Component |
Version |
|---|---|
TI ARM R5F Clang Compiler tools |
3.2.2.LTS |