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IEC60730_clock_fail_test.h
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/* --COPYRIGHT--,BSD
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* Copyright (c) 2016, Texas Instruments Incorporated
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* All rights reserved.
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*
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* Redistribution and use in source and binary forms, with or without
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* modification, are permitted provided that the following conditions
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* are met:
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*
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* * Redistributions of source code must retain the above copyright
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* notice, this list of conditions and the following disclaimer.
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*
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* * Redistributions in binary form must reproduce the above copyright
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* notice, this list of conditions and the following disclaimer in the
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* documentation and/or other materials provided with the distribution.
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*
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* * Neither the name of Texas Instruments Incorporated nor the names of
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* its contributors may be used to endorse or promote products derived
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* from this software without specific prior written permission.
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*
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* THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND CONTRIBUTORS "AS IS"
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* AND ANY EXPRESS OR IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO,
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* THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR
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* PURPOSE ARE DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT OWNER OR
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* CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL,
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* EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO,
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* PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS;
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* OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY,
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* WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR
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* OTHERWISE) ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE,
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* EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.
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* --/COPYRIGHT--*/
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#ifndef IEC60730_CLOCK_FAIL_TEST_H_
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#define IEC60730_CLOCK_FAIL_TEST_H_
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//*****************************************************************************
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//
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//The following include is added to use C99 data types
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//
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//*****************************************************************************
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#include "stdint.h"
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#ifdef __cplusplus
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extern
"C"
{
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#endif
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//*****************************************************************************
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//
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//The following structure is the argument for IEC60730_ADC_TEST_testAdcInput()
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//
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//*****************************************************************************
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extern
uint8_t
IEC60730_OSCILLATOR_TEST_testOsc
(
void
);
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#ifdef __cplusplus
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}
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#endif
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#endif
IEC60730_OSCILLATOR_TEST_testOsc
uint8_t IEC60730_OSCILLATOR_TEST_testOsc(void)
Definition:
IEC60730_clock_fail_test.c:82
Copyright © 2015, Texas Instruments Incorporated