SDL ECC

Table of Contents

• Introduction
  • Use Cases
• Supported Combinations
• Steps to Run the Example
• Sample Output

Introduction

This example shows setup and usage of some ECC Aggregators for a few events in the Main domain. It shows the following:

• Setup of an ESM application callback to receive Single Error Correction (SEC) and Double Error Detection (DED) events and setup of ECC Aggregators in general
• Triggering of ECC events for a small number of RAM IDs, including Interconnect type and Wrapper type
• Printing out error information within the ECC callback upon reception of ECC events

The following use cases are implemented in this example:

Use Cases

Use Case	Description
UC-0	Single DED error on Main ESM for wrapper RAM ID type
UC-1	Single SEC error on Main ESM for wrapper RAM ID type
UC-2	Parity error injection on Main ESM for interconnect RAM ID type

Supported Combinations

Parameter	Value
CPU + OS	m4fss0-0 nortos
	r5fss0-0 nortos
Toolchain	ti-arm-clang
Board	am64x-evm
Example folder	examples/sdl/ecc/

Steps to Run the Example

• When using CCS projects to build, import the CCS project for the required combination and build it using the CCS project menu (see Using SDK with CCS Projects).
• When using makefiles to build, note the required combination and build using make command (see Using SDK with Makefiles)
• Launch a CCS debug session and run the executable, see CCS Launch, Load and Run

Sample Output

Shown below is a sample output when the application is run,

[BLAZAR_Cortex_M4F_1]
ECC Example Application
 
Unit tests started ...
 
ECC_Example_init: Init MAIN ESM complete
 
 
ECC_Example_init: Init WKUP ESM complete
 
 
 
SDTF_init: AGGR0 ECC Init complete
 
 
 
 ESM Safety Example tests: starting
 
 AGGR0 Double bit error inject Example test UC-1: starting
 
 AGGR0 Double bit error inject test: Subtype 0x00000001 test complete
 
 Waiting for ESM Interrupt
 
 
 
UC-1: Got Low priority ESM Interrupt
 
 
 
 AGGR0 Double bit error inject Example test UC-2: starting
 
 AGGR0 Double bit error inject test: Subtype 0x00000002 test complete
 
 Waiting for ESM Interrupt
 
 
 
 UC-2: Got High priority ESM Interrupt
 
 
 
 
 
**** AGGR0 Memory Parity TEST ****
 
 
 
 AGGR0 Single bit error self test: Subtype 0x00000001 test complete
 
 Waiting for ESM Interrupt
 
 
 
 Memory Parity Error Test Complete
 
 
 
 ECC Safety Example tests: success
 ECC UC-1 and UC-2 Test
All Use_Cases have passed.
../../../ecc_main.c:259:ECC_Example_app:MCUSDK-0:PASS
 
-----------------------
1 Tests 0 Failures 0 Ignored
All tests have passed

[R5F]
ECC Example Application
 
ECC_Test_init: Exception init complete
 
ECC_Test_init: Initialize of R5FSS0 CORE0 ECC Memory is complete
ECC_Example_init: Init MAIN ESM complete
 
ECC_Example_init: Init MCU ESM complete
 
 
 
SDTF_init: AGGR1 ECC Init complete
 
 
 
 ESM Safety Example tests: starting
 
 AGGR1 Double bit error inject Example test UC-1: starting
 
 AGGR1 Double bit error inject test: Subtype 0x00000002 test complete
 
 Waiting for ESM Interrupt
 
 
 
UC-1: Got Low priority ESM Interrupt
 
 
 
 AGGR1 Double bit error inject Example test UC-2: starting
 
 AGGR1 Double bit error inject test: Subtype 0x00000001 test complete
 
 Waiting for ESM Interrupt
 
 
 
 UC-2: Got High priority ESM Interrupt
 
 
 
 
 
**** AGGR1 Memory Parity TEST ****
 
 
 
 AGGR1 Single bit error self test: Subtype 0x00000002 test complete
 
 Waiting for ESM Interrupt
 
 
 
 Memory Parity Error Test Complete
 
 
 
 ECC Safety Example tests: success
 ECC UC-1 and UC-2 Test
 
All Use_Cases have passed.