ECC

Table of Contents

• Features Supported
• SysConfig Features
• Features NOT Supported
• Important Usage Guidelines
• Example Usage
• API

To increase functional and system reliability, the memories in many device modules and subsystems are protected by Error Correcting Code (ECC), which performs Single Error Correction (SEC) and Double Error Detection (DED). Detected errors are reported via ESM. Single bit errors are corrected, and double bit errors are detected. The ECC Aggregator is connected to these memory and interconnect components which have the ECC. The ECC aggregator provides access to control and monitor the ECC protected memories in a module or subsystem.

SDL provides support for ECC aggregator configuration. Each ECC aggregator instance can be independently configured through the same SDL API by passing a different instance. The safety manual also defines test-for-diagnostics for the various IPs with ECC/parity support. The SDL also provides the support for executing ECC aggregator self-tests, using the error injection feature of the ECC aggregator. The ECC aggregators should be configured at startup, after running BIST.

Features Supported

The SDL provides support for the ECC through:

• ECC Configuration API
• ECC self-test API
• ECC error injection API
• ECC static register readback API
• ECC error status APIs

There are 49 ECC aggregators on the device each supporting multiple memories and interconnects.

SysConfig Features

• None

Features NOT Supported

• None

Important Usage Guidelines

There are two types of ECC aggregator RAM IDs supported on the device (wrapper and interconnect). The wrapper types are used for memories where local computations are performed for particular processing cores in the device, and the interconnect types are utilized for interconnect bus signals between cores or to/from peripherals.

For wrapper RAM ID types, after injecting an error, the memory associated with that RAM ID needs to be accessed in order to trigger the error interrupt event. It is the application's responsibility to trigger the error event through memory access after injecting the error.

Example Usage

The following shows an example of SDL ECC API usage by the application to set up the ECC to monitor for errors, as well as how to perform ECC self-test. The ESM should be configured to notify of the desired ECC events for the IPs. Please refer to the TRM for a list of the ESM events.

The following function is required to be defined by the application. It is used by the ECC module to notify the application in case of certain ECC errors that are reported through the R5F exception handlers. If it is not defined, it will result in a linker error. An example implementation is given below.

void SDL_ECC_applicationCallbackFunction(SDL_ECC_MemType eccMemType,
                                         uint32_t errorSrc,
                                         uint32_t address,
                                         uint32_t ramId,
                                         uint64_t bitErrorOffset,
                                         uint32_t bitErrorGroup)
{
 
    DebugP_log("\r\n  ECC Error Call back function called : eccMemType %d, errorSrc 0x%x, " \
                "address 0x%x, ramId %d, bitErrorOffset 0x%04x%04x, bitErrorGroup %d\n",
                eccMemType, errorSrc, address, ramId, (uint32_t)(bitErrorOffset >> 32),
                (uint32_t)(bitErrorOffset & 0x00000000FFFFFFFF), bitErrorGroup);
    DebugP_log("\r  Take action \n");
 
    /* Any additional customer specific actions can be added here */
 
}

Initialization structure for ESM instances

SDL_ESM_config ECC_Test_esmInitConfig_MAIN =
{
    .esmErrorConfig = {1u, 8u}, /* Self test error config */
    .enableBitmap = {0x00000006u, 0x00000000u, 0x0000000eu, 0x00003000u,
                     0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                    },
    /* Temporarily disabling vim compare error as well*/
    .priorityBitmap = {0x00000006u, 0x00000000u, 0x0000000eu, 0x00003000u,
                       0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        },
    .errorpinBitmap = {0x00000006u, 0x00000000u, 0x0000000eu, 0x00003000u,
                       0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                      },
};
 
SDL_ESM_config ECC_Test_esmInitConfig_MCU =
{
    .esmErrorConfig = {0u, 3u}, /* Self test error config */
    .enableBitmap = {0x000c0000u, 0x00000000u, 0x00000000u, 0x00000000u,
                    0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                    0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                    0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                    0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                    0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                    0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                    0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                    },
    .priorityBitmap = { 0x000c0000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        },
    .errorpinBitmap = { 0x000c0000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                        0x00000000u, 0x00000000u, 0x00000000u, 0x00000000u,
                      },
};

To configure ECC for an instance and specified ram IDs:

static SDL_ECC_MemSubType ECC_Test_AGGR0_A0subMemTypeList[MAIN_AGGR0_AGGR0_MAX_MEM_SECTIONS] =
{ 
    SDL_ECC_AGGR0_SAM62A_SEC_HSM_ECC_AGGR_AM62A_MAIN_IPCSS_CBASS_HSM_CLK_2_CLK_EDC_CTRL_CBASS_INT_HSM_CLK_2_BUSECC_RAM_ID,
    SDL_ECC_AGGR0_SAM62A_SEC_HSM_ECC_AGGR_AM62A_MAIN_CENTRAL_CBASS_HSM_CLK_1_CLK_EDC_CTRL_CBASS_INT_HSM_CLK_1_BUSECC_RAM_ID,
};
 
static SDL_ECC_InitConfig_t ECC_Test_AGGR0A0ECCInitConfig =
{
    .numRams = MAIN_AGGR0_AGGR0_MAX_MEM_SECTIONS,
    .pMemSubTypeList = &(ECC_Test_AGGR0_A0subMemTypeList[0]),
};
 
static SDL_ECC_MemSubType ECC_Test_PSRAM0subMemTypeList[PSRAM0_MAX_MEM_SECTIONS] =
{ 
    SDL_PSRAMECC1_PSRAM256X32E_ECC_AGGR_PSRAM256X32E_PSRAM0_ECC_RAM_ID,
};
 
static SDL_ECC_InitConfig_t ECC_Test_PSRAM0ECCInitConfig =
{
    .numRams = PSRAM0_MAX_MEM_SECTIONS,
    .pMemSubTypeList = &(ECC_Test_PSRAM0subMemTypeList[0]),
};
 
static SDL_ECC_MemSubType ECC_Test_MCUMCAN1subMemTypeList[MCUMCAN1_MAX_MEM_SECTIONS] =
{ 
    SDL_MCU_MCAN1_MCANSS_MSGMEM_WRAP_ECC_AGGR_MCANSS_MSGMEM_WRAP_MSGMEM_ECC_RAM_ID,
};
 
static SDL_ECC_InitConfig_t ECC_Test_MCUMCAN1ECCInitConfig =
{
    .numRams = MCUMCAN1_MAX_MEM_SECTIONS,
    .pMemSubTypeList = &(ECC_Test_MCUMCAN1subMemTypeList[0]),
};

Initialization of ECC

int32_t ECC_Example_init (void)
{
    int32_t retValue=0;
    void *ptr = (void *)&arg;
    SDL_ErrType_t result;
 
    if (retValue == SDL_APP_TEST_PASS) {
        /* Initialize MAIN ESM module */
        result = SDL_ESM_init(SDL_ESM_INST_MAIN_ESM0, &ECC_Test_esmInitConfig_MAIN, SDL_ESM_applicationCallbackFunction, ptr);
        if (result != SDL_APP_TEST_PASS) {
            /* print error and quit */
            DebugP_log("\rECC_Example_init: Error initializing MAIN ESM: result = %d\n\n", result);
 
            retValue = SDL_APP_TEST_FAILED;
        } else {
            DebugP_log("\rECC_Example_init: Init MAIN ESM complete \n\n");
        }
    }
    if (retValue == SDL_APP_TEST_PASS) 
    {
        /* Initialize WKUP ESM module */
 
        result = SDL_ESM_init(SDL_ESM_INST_WKUP_ESM0, &ECC_Test_esmInitConfig_MCU, SDL_ESM_applicationCallbackFunction, ptr);
 
        if (result != SDL_APP_TEST_PASS) {
            /* print error and quit */
            DebugP_log("\rECC_Example_init: Error initializing WKUP ESM: result = %d\n\n", result);
 
            retValue = SDL_APP_TEST_FAILED;
        } else {
            DebugP_log("\rECC_Example_init: Init WKUP ESM complete \n\n");
        }
    }
    if (retValue == SDL_APP_TEST_PASS) 
    {
        /* Initialize AGGR0 SAM62A ECC */
        result = SDL_ECC_init(SDL_ECC_AGGR0_SAM62A_SEC_HSM_ECC_AGGR, &ECC_Test_AGGR0A0ECCInitConfig);
        if (result != SDL_APP_TEST_PASS) 
        {
            /* print error and quit */
            DebugP_log("\r\nECC_init: Error initializing SAM62A ECC: result = %d\r\n", result);
 
            retValue = SDL_APP_TEST_FAILED;
        } 
        else {
            DebugP_log("\r\nECC_init: AGGR0 ECC Init complete \r\n");
        }
        
        /* Initialize PSRAM ECC */
        result = SDL_ECC_init(SDL_PSRAMECC1_PSRAM256X32E_ECC_AGGR, &ECC_Test_PSRAM0ECCInitConfig);
        if (result != SDL_APP_TEST_PASS) 
        {
            /* print error and quit */
            DebugP_log("\r\nECC_init: Error initializing PSRAM ECC: result = %d\r\n", result);
 
            retValue = SDL_APP_TEST_FAILED;
        } 
        else {
            DebugP_log("\r\nECC_init: PSRAM ECC Init complete \r\n");
        }
        
        /* Initialize ECC */
        result = SDL_ECC_init(SDL_MCU_MCAN1_MCANSS_MSGMEM_WRAP_ECC_AGGR, &ECC_Test_MCUMCAN1ECCInitConfig);
        if (result != SDL_APP_TEST_PASS) 
        {
            /* print error and quit */
            DebugP_log("\r\nECC_init: Error initializing MCU MCAN1 ECC: result = %d\r\n", result);
 
            retValue = SDL_APP_TEST_FAILED;
        } 
        else {
            DebugP_log("\r\nECC_init: MCU MCAN1 ECC Init complete \r\n");
        }
    }
    return retValue;
}

Once the ECC is configured, then error notifications will come to the ESM module, and will activate the ESM-registered application callback. The application callback may want to retrive the error information in order to take some action based on the error, like clearing the ECC interrupts, logging the error information, or some other action:

retVal = SDL_ECC_getESMErrorInfo(esmInst, intSrc, &eccmemtype, &eccIntrSrc);
 
/* Any additional customer specific actions can be added here */
retVal = SDL_ECC_getErrorInfo(eccmemtype, eccIntrSrc, &eccErrorInfo);

To clear and acknowledge the ECC interrupt:

if (eccErrorInfo.injectBitErrCnt != 0)
{
    SDL_ECC_clearNIntrPending(eccmemtype, eccErrorInfo.memSubType, eccIntrSrc, SDL_ECC_AGGR_ERROR_SUBTYPE_INJECT, eccErrorInfo.injectBitErrCnt);
}
else
{
    SDL_ECC_clearNIntrPending(eccmemtype, eccErrorInfo.memSubType, eccIntrSrc, SDL_ECC_AGGR_ERROR_SUBTYPE_NORMAL, eccErrorInfo.bitErrCnt);
}
 
retVal = SDL_ECC_ackIntr(eccmemtype, eccIntrSrc);

Execute an ECC Self-Test for a specified ECC aggregator (memtype) and RAM Id (subtype):

/* Note the address is relative to start of ram */
injectErrorConfig.pErrMem = (uint32_t *)(0x04E10000u);
result = SDL_ECC_selfTest(SDL_MCU_MCAN1_MCANSS_MSGMEM_WRAP_ECC_AGGR,
                          SDL_MCU_MCAN1_MCANSS_MSGMEM_WRAP_ECC_AGGR_MCANSS_MSGMEM_WRAP_MSGMEM_ECC_RAM_ID,
                          SDL_INJECT_ECC_ERROR_FORCING_1BIT_ONCE,
                          &injectErrorConfig,
                          100000);

if (result != SDL_PASS ) {
     DebugP_log("\r\nSingle bit error self test at pErrMem 0x%p test failed\r\n",
                 injectErrorConfig.pErrMem);
    retVal = -1;
} else {
 
    DebugP_log("\r\nSingle bit error self test at pErrMem 0x%p: test complete\r\n",
                injectErrorConfig.pErrMem);
}
 
return retVal;

Inject an error for a specified ECC aggregator (memtype) and RAM Id (subtype)

/* Note the address is relative to start of ram */
injectErrorConfig.pErrMem = (uint32_t *)(0x04E10000u);
 
/* Run one shot test for MCU MCAN1 1 bit error */
injectErrorConfig.flipBitMask = 0x10;
result = SDL_ECC_injectError(SDL_MCU_MCAN1_MCANSS_MSGMEM_WRAP_ECC_AGGR,
                             SDL_MCU_MCAN1_MCANSS_MSGMEM_WRAP_ECC_AGGR_MCANSS_MSGMEM_WRAP_MSGMEM_ECC_RAM_ID,
                             SDL_INJECT_ECC_ERROR_FORCING_1BIT_ONCE,
                             &injectErrorConfig);

if (result != SDL_EFAIL ) {
    DebugP_log("\r\n Error inject at pErrMem 0x%p EFAIL test failed",
                injectErrorConfig.pErrMem);
    retVal = -1;
} else {
    /* Access the memory where injection is expected */
    testLocationValue = injectErrorConfig.pErrMem[0];
 
    DebugP_log("\r\n Error inject at pErrMem 0x%p: EFAIL test complete",
                injectErrorConfig.pErrMem);
}
 
return retVal;

Read the Static registers:

/* Read back the static registers */
result = SDL_ECC_getStaticRegisters(SDL_ECC_AGGR0_SAM62_SEC_ECC_AGGR, &staticRegs);

/* Read back the static registers */
result = SDL_ECC_getStaticRegisters(SDL_MCU_MCAN1_MCANSS_MSGMEM_WRAP_ECC_AGGR, &staticRegs);

if (result != SDL_PASS) {
    /* print error and quit */
    DebugP_log("\r\nECC_Test_init: Error reading the static registers: result = %d\n\n");
 
    retValue = -1;
} else {
    DebugP_log("\r\nECC_Test_init: M4F Memtype Register Readback successful \n\n");
}

API

APIs for SDL ECC