1.3. Release Notes - 10_01_00

1.3.1. Introduction

This release notes provides important information that will assist you in using the SDL software package for the J721E family of devices. This document provides the product information and known issues that are specific to the SDL software package.

New features added / supported is listed below and defects fixed are highlighted in Fixed Issues. Also please check Upgrade and Compatibility for backward compatibility

1.3.2. What’s New

  • Bug fixes

1.3.3. Supported Modules

SDL support for the following modules are available:

  • R5F PMU, MPU, RAT and VIM

  • ESM

  • PBIST

  • LBIST

  • POK

  • VTM

  • TOG

  • ECC

  • RTI

  • R5F CCM

  • DCC

  • MCRC

  • ROM CHECKSUM

Safety Examples for the following modules:

  • ESM

  • POK

  • VTM

  • TOG

  • DCC

  • RTI

  • ECC

  • BIST

  • ROM CHECKSUM

1.3.4. Upgrade and Compatibility

None

1.3.5. Supported Devices

Platform

Supported Devices

Supported EVMs

J721E SR1.1 and SR2.0
Functional safety Devices:
DRA829
TDA4VM
DRA829Vx Evaluation Module
(DRA829VXEVM)

1.3.6. Fixed Defects

ID

Summary

Comments

PROC_SDL-6349

SDL ECC error injection test fails for certain IPs in ecc_func_app SDL_CBASS_ECC_AGGR0

Failures were due to not having idle cycles in the test application, which was due to A72 core being powered in the test app without valid boot vectors.

PROC_SDL-6297

SDL ECC error injection test fails for certain IPs in ecc_func_app SDL_MAIN_RC_ECC_AGGR0

Failures were due to not having idle cycles in the test application, which was due to A72 core being powered in the test app without valid boot vectors.

PROC_SDL-6746

ECC: CPSW error bit is reported incorrectly.

CPSW metadata is updated and SDL_ECC_getErrorInfo is updated to return the raw values for row and bit1 which is needed for getting the location of the CPSW ECC error.

PROC_SDL-6745

ECC: CPSW error inject bits 32-255 cannot be specified in flipBitMask

CPSW metadata is updated and SDL_ECC_injectErrorConfig is updated to accept raw values for bit1 and bit2 for error injection in addition to the existing flipBitMask. If any bit is specified in the flipBitMask when calling the API, then the flipBitMask will be used for the values of bit1 and bit2. However if the flipBitMask is set to 0 then the values in bit1 and bit2 will be used. Please refer to the API documentation for more details.

PROC_SDL-8318

SDL POK is failing for SDL_POR_POKHV_OV_ID instance in PG2.0 board

None

1.3.7. Open Defects

ID

Summary

Workaround

PROC_SDL-6298

sdl_pok_test_app fails for SDL_POK_VMON_EXT_OV_ID instance

None - This issue is under investigation. Root cause may be hardware configuration and/or pre-test sequence in the application.

PROC_SDL-7421

ECC DED test is failing for certain RAM ID’s in SDL_ECC_MEMTYPE_MAIN_MSMSC_AGGR0.

None - This issues is under investigation

PROC_SDL-8258

SDL ECC error injection test for DSS ECC aggregators failure

None - This issue is under investigation. Accessing some DSS ECC Aggregators leads to data abort. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence.

PROC_SDL-8249

SDL ECC error injection test for CSI ECC aggregators failure

None - This issue is under investigation. Accessing some CSI ECC Aggregators leads to data abort. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence.

PROC_SDL-8248

SDL ECC error injection test for PCIE ECC aggregators failure

None - This issue is under investigation. Accessing some PCIE ECC Aggregator leads to data abort. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence.

PROC_SDL-8317

SDL PBIST test is failing for HC instance in PG 2.0 board

None - This issues is under investigation

1.3.8. Migration Information

Dependency on C7X image is removed for compute cluster instances. PBIST example, pbist_test_app and sdl_pbist_test_app can be tested as standalone images.

1.3.9. Tool Chain Information

Component

Version

TI ARM R5F Clang Compiler tools

3.2.2.LTS