SDL Release Notes

Table of Contents

Introduction

This release notes provides important information that will assist you in using the SDL software package for the J721E family of devices. This document provides the product information and known issues that are specific to the SDL software package.

New features added / supported is listed below and defects fixed are highlighted in Fixed Defects. Also please check Upgrade and Compatibility for backward compatibility

What’s New

Supported Modules

SDL Support for the following modules is available from previous release:

Safety Examples for the following modules:

Upgrade and Compatibility

None

Supported Devices

Fixed Defects

ID Summary
PROC_SDL-6349 SDL ECC error injection test fails for certain IPs in ecc_func_app SDL_CBASS_ECC_AGGR0
PROC_SDL-6297 SDL ECC error injection test fails for certain IPs in ecc_func_app SDL_MAIN_RC_ECC_AGGR0
PROC_SDL-6746 ECC: CPSW error bit is reported incorrectly
PROC_SDL-6745 ECC: CPSW error inject bits 32-255 cannot be specified in flipBitMask
PROC_SDL-8318 sdl:j721e PG2.0: POK is failing for SDL_POR_POKHV_OV_ID instance

Open Defects

ID Summary
PROC_SDL-6928 sdl_pok_test_app fails for SDL_POK_VMON_EXT_OV_ID instance
PROC_SDL-7421 ECC DED test is failing for certain RAM ID's in SDL_ECC_MEMTYPE_MAIN_MSMSC_AGGR0.
PROC_SDL-8258 SDL ECC error injection test for DSS ECC aggregators failure
PROC_SDL-8249 SDL ECC error injection test for CSI aggregators failure
PROC_SDL-8248 SDL ECC error injection test for PCIE aggregators failure
PROC_SDL-8317 sdl:j721e PG2.0: PBIST test is failing for HC instance

Migration Information

Dependency on C7X image is removed for compute cluster instances. PBIST example, pbist_test_app and sdl_pbist_test_app can be tested as standalone images.

Tool Chain Information