1.2. Release Notes - 01_04_00¶
1.2.1. Introduction¶
This release notes provides important information that will assist you in using the SDL software package for the J784S4 family of devices. This document provides the product information and known issues that are specific to the SDL software package.
New features added / supported is listed below and defects fixed are highlighted in Fixed Issues. Also please check Upgrade and Compatibility for backward compatibility
1.2.2. What’s New¶
Bug fixes
1.2.3. Supported Modules¶
SDL support for the following modules are available:
R5F PMU, MPU, RAT
ESM
PBIST
LBIST
VTM
ECC
RTI
DCC
MCRC
R5F CCM
TOG
POK
R5F VIM
ROM CHECKSUM
Not supported:
None.
1.2.4. Upgrade and Compatibility¶
Below ECC aggregator metadata has changed resulting in new macros:
SDL_COMPUTE_CLUSTER0_AW4_ECC0_AGGR
SDL_COMPUTE_CLUSTER0_AW5_ECC0_AGGR
SDL_COMPUTE_CLUSTER0_AW6_ECC0_AGGR
SDL_COMPUTE_CLUSTER0_AW7_ECC0_AGGR
1.2.5. Supported Devices¶
Supported Platform |
|---|
J784S4 |
1.2.6. Fixed Defects¶
ID |
Module |
Summar |
Comments |
|---|---|---|---|
PROC_SDL-7823 |
POK |
Setting trim value for non-Ping pong mode POKs accesses invalid offset |
None. |
PROC_SDL-8142 |
ECC |
Incorrect base address for the SDL_WKUP_SMS0_1 aggr |
None. |
PROC_SDL-7650 |
POK |
POK instance IPOK_VDD_CPU1 not included in the SDL header file |
None. |
PROC_SDL-7612 |
ESM |
Remove ESM Error Pin Counter Value Register from static register read API |
None. |
PROC_SDL-7597 |
LBIST |
secondaryCoreNeeded should be set to false for SDL_LBIST_INST_A72_1 |
None. |
PROC_SDL-7487 |
TOG |
Duplicate macro definition SDL_IP_TOG_TOP_H_ in the SDL header files (STOG and MTOG) |
None. |
PROC_SDL-7430 |
ECC |
ECC DED test is failing for certain RAM ID’s for SDL_COMPUTE_CLUSTER0_AW7_C7X_1_AGGR0 |
None - This issue is under investigation. |
PROC_SDL-7428 |
ECC |
ECC DED test is failing for certain RAM ID’s for SDL_COMPUTE_CLUSTER0_AW6_C7X_1_ECC_AGGR |
None - This issue is under investigation. |
PROC_SDL-7426 |
ECC |
ECC DED test is failing for certain RAM ID’s for SDL_COMPUTE_CLUSTER0_AW5_C7X_1_ECC_AGGR |
None - This issue is under investigation. |
PROC_SDL-7424 |
ECC |
ECC DED test is failing for certain RAM ID’s for SDL_COMPUTE_CLUSTER0_AW4_C7X_ECC_AGGR |
None - This issue is under investigation. |
PROC_SDL-7402 |
BIST |
Mismatch between function declaration and definition for SDL_PBIST_{start, startNeg} and SDL_LBIST_programConfig |
None. |
PROC_SDL-6448 |
PBIST |
PBIST MAINR5F1 instance reset sequence disabled |
None. |
PROC_SDL-6356 |
ECC |
Error Injection fails for ECC Aggregator COMPUTE_CLUSTER0_MSMC_ECC_AGGR0 for certain RAM ID’s. |
None. |
PROC_SDL-8316 |
MCRC |
SDL MCRC test is failing for MAIN NAVSS instance in release mode |
None. |
1.2.7. Known Issues and Limitations¶
ID |
Module |
Summary |
Workaround |
|---|---|---|---|
PROC_SDL-6360 |
ECC |
Error Injection fails for ECC Aggregator ECC_AGGR0 for certain RAM ID’s. |
None - This issue is under investigation. Root cause may be incorrect metadata and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. Due to this, the ECC error inject functionality for the mentioned IPs and endpoints is not usable in this release. |
PROC_SDL-6359 |
ECC |
Error Injection fails for ECC Aggregator ECC_AGGR4 for certain RAM ID’s. |
None - This issue is under investigation. Root cause may be incorrect metadata and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. Due to this, the ECC error inject functionality for the mentioned IPs and endpoints is not usable in this release. |
PROC_SDL-4141 |
TOG |
1 STOG instances error injection test is failing and are not included in the test application. (STOG17) |
None - This issue is under investigation. |
PROC_SDL-7422 |
ECC |
ECC DED test is failing for certain RAM ID’s for SDL_COMPUTE_CLUSTER0_MSMC_ECC_AGGR0 |
None - This issue is under investigation. |
PROC_SDL-7423 |
ECC |
ECC DED test is failing for certain RAM ID’s for SDL_COMPUTE_CLUSTER0_AW4_MSMC1_ECC_AGGR0 |
None - This issue is under investigation. |
PROC_SDL-7425 |
ECC |
ECC DED test is failing for certain RAM ID’s for SDL_COMPUTE_CLUSTER0_AW5_MSMC1_ECC_AGGR0 |
None - This issue is under investigation. |
PROC_SDL-7427 |
ECC |
ECC DED test is failing for certain RAM ID’s for SDL_COMPUTE_CLUSTER0_AW6_MSMC1_ECC_AGGR0 |
None - This issue is under investigation. |
PROC_SDL-7429 |
ECC |
ECC DED test is failing for certain RAM ID’s for SDL_COMPUTE_CLUSTER0_AW7_MSMC1_ECC_AGGR0 |
None - This issue is under investigation. |
PROC_SDL-8248 |
ECC |
SDL ECC error injection test for PCIE ECC aggregators failure |
None - This issue is under investigation. Accessing some PCIE ECC Aggregator leads to data abort. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
PROC_SDL-8249 |
ECC |
SDL ECC error injection test for CSI ECC aggregators failure |
None - This issue is under investigation. Accessing some CSI ECC Aggregators leads to data abort. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
PROC_SDL-8258 |
ECC |
SDL ECC error injection test for DSS ECC aggregators failure |
None - This issue is under investigation. Accessing some DSS ECC Aggregators leads to data abort. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
PROC_SDL-8286 |
ECC |
SDL ECC error injection test for I3C ECC aggregators failure |
None - This issue is under investigation. Accessing some I3C ECC Aggregators leads to data abort. Root cause may be hardware configuration and/or pre-test sequence in the application. The IP associated with the ECC aggregator may need some additional power/init sequence. |
1.2.8. Migration Information¶
Dependency on C7X image is removed for compute cluster instances. PBIST example, pbist_test_app and sdl_pbist_test_app can be tested as standalone images.
1.2.9. Tool Chain Information¶
Component |
Version |
|---|---|
TI ARM R5F Clang Compiler tools |
3.2.2.LTS |