The parameter is used to test the results of the calibration process when multi-frequency scanning is enabled. If the MCU powers up in an environment with noise at one of the conversion frequencies, it is possible that the calibration algorithm may produce invalid calibration values at that frequency.

Implementation Notes

To determine if a calibration value may be corrupt, after the calibration process is complete each element is sampled. Out of that sample set, the peak-to-peak difference at each frequency in the set is compared with the Calibration Noise Limit. If the peak-to-peak variation of the measurement results at a given conversion frequency is greater than the Calibration Noise Limit parameter, that frequency’s calibration values are marked as invalid. When this happens, they are replaced with the calibration values of the nearest valid conversion frequency.

Affected Software Parameters
Selecting this option sets the CAPT_CALIBRATION_NOISE_LIMIT compile-time noise immunity definition in the CAPT_UserConfig.h file to seleted calibration noise limit when source code is generated.